Transmission Electron Microscopy (TEM)
Transmission electron microscopy (TEM) is a highly effective technique for capturing high-resolution images of a material’s microstructure. It functions by passing a focused electron beam through an ultra-thin sample and detecting the electrons that emerge on the other side.
How It Works
- A high-energy beam of electrons passes through a thin sample
- The interactions between the electrons and the atoms are use to form an image
- The image can reveal details like crystal structure, grain boundaries, and dislocations.
