Atomic Force Microscopy (AFM)
A high-resolution technique used to image and measure the surface topography of materials at the nanoscale.
How It Works
- Scanning probe - A tiny, sharp tip attached to a cantilever is scanned across the sample surface in a raster pattern.
- Force detection - As the tip interacts with the sample, the cantilever deflects, and this deflection is measured by a laser beam focused on the cantilever.
- Image generation - The deflection data is translated into a topographic image representing the surface profile of the sample.
