Scanning Transmission Electron Microscope (STEM)

Scanning transmission electron microscopy (STEM) is a sophisticated imaging method used to examine the structure and composition of materials at nanometer to sub-atomic scales. By scanning a focused electron beam over an ultra-thin sample and simultaneously collecting multiple signals, STEM delivers high-resolution images along with detailed spectroscopic information.

How It Works
  • High resolution - STEM provides spatial resolution, enabling the visualization of individual atoms within a material.
  • Scanning mechanism - Unlike conventional TEM, which uses a broad electron beam, STEM scans a finely focused electron probe across the sample, allowing for localized analysis.
  • Analytical capabilities - STEM can be used in conjunction with other techniques like energy-dispersive X-ray spectroscopy (EDS) to determine the elemental composition of a sample at specific locations.