Scanning Electron Microscopy (SEM)
Scanning electron microscopy (SEM) is a commonly used method for examining material surfaces. It operates by directing a focused electron beam across the sample’s surface and detecting the secondary electrons that are emitted as a result
How It Works
- A beam electrons scans across the surface of a sample in a raster pattern The interaction emits electrons and X-rays.
- The electrons and X-rays are processed to form an image of the surface.
