Fault Isolation

Identifying the specific location and cause of overheating issues in electrical equipment or systems.

How It Works
  • Hot Spot
    Identifying the specific location and cause of overheating issues in electrical equipment or systems
  • Photoemission Microscopy (PHEM)
    Allows for the precise localization of defects by detecting the faint light emitted from a faulty area when electrical current flows through it, essentially “pinpointing” the source of a malfunction within a chip.